Luncheon
Workshop on Imaging Spectroscopic Ellipsometry, Singh Center for Nanotechnology
September 11th, 2025. - 12 PM
Singh Center for Nanotechnology
- Address: Krishna P. Singh Center for Nanotechnology
- 3205 Walnut Street Philadelphia, PA 19104
Talk: Imaging Spectroscopic Ellipsometry: Advancing Beyond Conventional Techniques
Imaging Spectroscopic Ellipsometry (ISE) is reshaping how we visualize and analyze thin films and nanostructures by moving beyond the limitations of traditional point-based ellipsometry. By combining spectroscopic data with high-resolution spatial mapping, ISE provides detailed insight into the uniformity, thickness, and optical properties of materials across entire sample surfaces—non-destructively and with sub-micron resolution. This talk will explore how ISE is applied to cutting-edge materials such as 2D layers, patterned semiconductors, and organic coatings, and how it opens new frontiers in both research and industrial inspection. We’ll highlight case studies, discuss system design innovations, and demonstrate how ISE bridges the gap between materials innovation and actionable insight.
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Program
12:00 PM - Welcome and Luncheon
Gerald G. Lopez, Ph.D. | Director of Operations and Business Development & Center Associate Director Singh Center for Nanotechnology
Gilbert Min, Ph.D. | Technical Manager, Park Systems, Inc.
12:10 PM - Keynote Presentation
Mangesh Diware, Ph.D. | Senior Applications Scientist | Park Systems. Inc.
Title: Imaging Spectroscopic Ellipsometry: Advancing Beyond Conventional Techniques
13:30 Demo Sessions - Laboratory for Research on the Structure of Matter - LRSM, Room 118
Tour of the Singh Center - Dr. Gerald Lopez
13:30 Demo Session Group 1: Imaging Spectroscopic Ellipsometer Accurion EP4
Presenter | Mangesh Diware, Ph.D. | Senior Applications Scientist | Park Systems. Inc.
14:30 Demo Session Group 2: Imaging Spectroscopic Ellipsometer Accurion EP4
1-on-1 Instrument sessions available starting at 9 AM . Please contact: Dr. Gilbert Min: gmin@parksystems.com